Uniform Depth Profiling in X-ray Photoelectron Spectroscopy (Electron Spectroscopy for Chemical Analysis)

Author： Bradley L. Bosworth Y. M. Briggs D. Gibson V. A. Oldman R. J. Evans A. C. Franks J.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.32, Iss.2, 1978-03, pp. : 175-177

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