Quantitative Determination of Si, Al, Ti, and Fe in Laterites and Bauxites by X-ray Fluorescence Using a Computer for Correction of Interelement Effects

Author： Schorin Hasso  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.33, Iss.6, 1979-11, pp. : 634-637

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