Analysis of a Polarizing Michelson Interferometer for Dual Beam Fourier Transform Infrared, Circular Dichroism Infrared, and Reflectance Ellipsometric Infrared Spectroscopies

Author： Dignam M. J.   Baker M. D.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.35, Iss.2, 1981-03, pp. : 186-193

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