Total Internal Reflection Raman Spectroscopy at the Critical Angle for Raman Measurements of Thin Films

Author： Iwamoto Reikichi   Ohta Koji   Miya Masaru   Mima Seiichi  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.35, Iss.6, 1981-11, pp. : 584-587

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