Author： Leroueille J.
Publisher： Society for Applied Spectroscopy
ISSN： 0003-7028
Source： Applied Spectroscopy, Vol.36, Iss.2, 1982-03, pp. : 153-155
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Abstract
An original method is developed to determine the carbon content in industrial samples (thin silicon wafers double-side polished) through IR spectrometry. This method permits to remove interference fringes in the infrared spectra by using the properties of Brewster incidence.
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