Further Developments in the Methodology of Surface Analysis by FT-IR: Quantitative Aspects of Diffuse Reflectance Methods

Author： Mckenzie M. T. Koenig J. L.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.39, Iss.3, 1985-05, pp. : 408-412

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