Determination of Silicon Dioxide in Silicon Carbide by Diffuse Reflectance Infrared Fourier Transform Spectrometry

Author: Tsuge Akira   Uwamino Yoshinori   Ishizuka Toshio  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.40, Iss.3, 1986-03, pp. : 310-313

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Abstract