Comprehensive Interferometric Characterization of Red and Near-Infrared Emissions of C, H, N, O, F, Cl, Br, I, P, S, and Si in a 370-W Microwave-Induced Helium Plasma

Author: Pivonka D. E.   Schleisman A. J. J.   Fateley W. G.   Fry R. C.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.40, Iss.6, 1986-08, pp. : 766-772

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