Intracavity Helium-Neon Laser Photothermal Deflection as a Sensitive Technique for Trace Gas Analysis

Author： Tran Chieu D.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.40, Iss.8, 1986-11, pp. : 1108-1110

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