Dynamic Background Correction by Wavelength Modulation in ICP Atomic Emission Spectrometry (AES) and its Application to Flow-Injection-ICP-AES

By Lépine L.   Provencher M.   Thammavong K.   Tran K. C.   Hubert J.  

Applied Spectroscopy, Vol. 46, Iss. 5, 1992-05 ,pp. : 864-872

Society for Applied Spectroscopy

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A Modulated Sample-Introduction System for ICP-Atomic Emission Spectrometry

By Steele A. W.   Hieftje G. M.  

Applied Spectroscopy, Vol. 40, Iss. 8, 1986-11 ,pp. : 1127-1131

Society for Applied Spectroscopy

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Purification of EDTA Monitored by Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES)

By Mitchell J. W.   Herring C.   Bylina E.  

Applied Spectroscopy, Vol. 38, Iss. 5, 1984-09 ,pp. : 653-660

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Coincidence Profiles for Sulfur Emission at 180.73 nm (Third Order) in ICP-AES

By Attar K. M.  

Applied Spectroscopy, Vol. 42, Iss. 8, 1988-11 ,pp. : 1493-1499

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Establishment of Compromise Conditions for Multielement Analysis by Inductively Coupled Plasma Emission Spectrometry: A Preliminary Report

By Berman S. S.   McLaren J. W.  

Applied Spectroscopy, Vol. 32, Iss. 4, 1978-07 ,pp. : 372-377

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