Characterization of OH Radical 306.4 nm Emission in Argon and Helium Reduced-Pressure ICPs

Author: Fleitz P. A.   Seliskar C. J.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.41, Iss.4, 1987-05, pp. : 679-682

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract