Beating the Nyquist Limit by Means of Interleaved Alternated Delay Sampling: Extension of Lower Mass Limit in Direct-Mode Fourier Transform Ion Cyclotron Resonance Mass Spectrometry

Author： Verdun Francis R.   Ricca Tom L.   Marshall Alan G.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.42, Iss.2, 1988-02, pp. : 199-203

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