Application of Waveguide Raman Spectroscopy to High-Index Dielectric Films

Author: Tallant David R.   Higgins Karen L.   Stewart Alan F.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.42, Iss.2, 1988-02, pp. : 326-330

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Abstract