Determination Near the Limit of Detection with a Sequential Scanning Inductively Coupled Plasma Emission Spectrometer

By Nygaard D. D.   Chase D. S.   Leighty D. A.  

Applied Spectroscopy, Vol. 37, Iss. 5, 1983-09 ,pp. : 432-435

Society for Applied Spectroscopy

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Absolute Determination of Characteristic X-Ray Yields with a Wavelength-Dispersive Spectrometer

By Merlet Claude   Llovet Xavier  

Microchimica Acta, Vol. 155, Iss. 1-2, 2006-09 ,pp. : 199-204

Springer Publishing Company

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Analytical Performance and Transport Studies Using Spark Sampling Followed by ICP Excitation with a Sequential Spectrometer

By Prell L. J.   Koirtyohann S. R.  

Applied Spectroscopy, Vol. 42, Iss. 7, 1988-09 ,pp. : 1221-1228

Society for Applied Spectroscopy

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A Rapid-Scanning Spectrometer with Wavelength Synchronization by a Laser Rotary Encoder for Versatile Applications to Atomic Emission Spectrometry

By Kitagawa K.   Sakakibara Y.   Tsuge S.  

Microchemical Journal, Vol. 63, Iss. 3, 1999-11 ,pp. : 333-343

Elsevier

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Determination of Wavelength Accuracy in the Near-Infrared Spectral Region Based on NIST's Infrared Transmission Wavelength Standard SRM 1921

By Lowry Stephen R.   Hyatt Jim   McCarthy William J.  

Applied Spectroscopy, Vol. 54, Iss. 3, 2000-03 ,pp. : 450-455

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