Spectroscopic Method for Measuring Surface Temperature That Is Independent of Material Emissivity, Surrounding Radiation Sources, and Instrument Calibration

Author: Markham James R.   Best Philip E.   Solomon Peter R.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.48, Iss.2, 1994-02, pp. : 265-270

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract