In situ X-ray absorption spectroscopy study of lithium insertion into sputtered WO 3 thin films

By Pauporte T.   Soldo-Olivier Y.   Faure R.  

Journal of Electroanalytical Chemistry and Interfacial Electrochemistry, Vol. 562, Iss. 1, 2004-01 ,pp. : 111-116

Elsevier

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FT-IR/ATR Study of Lithium Intercalation into Molybdenum Oxide Thin Film

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Applied Spectroscopy, Vol. 47, Iss. 6, 1993-06 ,pp. : 749-752

Society for Applied Spectroscopy

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FT-IR/ATR Analysis of the Silicon/Aqueous Solution Interface Using Sputtered Silicon Thin Films to Access the 1550-1100 cm^-1 Spectral Region

By Sperline Roger P.   Jeon Joong S.   Raghavan Srini  

Applied Spectroscopy, Vol. 49, Iss. 8, 1995-08 ,pp. : 1178-1182

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FT-IR spectroscopic investigation of the surface reaction of CH₄ with NO _x species adsorbed on Pd/WO₃–ZrO₂ catalyst

By Kantcheva Margarita   Cayirtepe Ilknur  

Catalysis Letters, Vol. 115, Iss. 3-4, 2007-06 ,pp. : 148-162

Springer Publishing Company

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IR Spectroscopic studies of charged-discharged crystalline WO 3 films

By Opara Krasovec U.   Surca Vuk A.   Orel B.  

Electrochimica Acta, Vol. 46, Iss. 13, 2001-04 ,pp. : 1921-1929

Elsevier

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