Optical Depth Profiling of Thin Films by Impulse Mirage Effect Spectroscopy. Part II: Measurements Using Wide-Band Modulated Excitation

Author: Schweitzer M. A.   Power J. F.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.48, Iss.9, 1994-09, pp. : 1076-1087

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