Quantitative Depth Profiling of Layered Samples Using Phase-Modulation FT-IR Photoacoustic Spectroscopy

Author： Jones Roger W. McClelland John F.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.50, Iss.10, 1996-10, pp. : 1258-1263

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