Author: Edwards H. G. M. Farwell D. W. Turner J. M. C. Williams A. C.
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.51, Iss.1, 1997-01, pp. : 101-107
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
FT-Raman Spectroscopy at 1.339 Micrometers
By Asselin Kelly J. Chase Bruce
Applied Spectroscopy, Vol. 48, Iss. 6, 1994-06 ,pp. :
FT-Raman Spectroscopy: Development and Justification
Applied Spectroscopy, Vol. 40, Iss. 2, 1986-02 ,pp. :
By Aust Jeffrey F. Cooper John B. Wise Kent L. Jensen Brian J.
Applied Spectroscopy, Vol. 53, Iss. 6, 1999-06 ,pp. :