Author: Zhao Jun McCreery Richard L.
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.51, Iss.11, 1997-11, pp. : 1687-1697
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Signal-to-Noise Considerations in FT-Raman Spectroscopy
Applied Spectroscopy, Vol. 43, Iss. 5, 1989-07 ,pp. :
By de Almeida Mariana Ramos de Sá Oliveira Kamila Stephani Rodrigo Cappa de Oliveira Luiz Fernando
Analytical Letters, Vol. 45, Iss. 17, 2012-11 ,pp. :
FT-Raman Spectroscopy at 1.339 Micrometers
By Asselin Kelly J. Chase Bruce
Applied Spectroscopy, Vol. 48, Iss. 6, 1994-06 ,pp. :
FT-Raman Spectroscopy: Development and Justification
Applied Spectroscopy, Vol. 40, Iss. 2, 1986-02 ,pp. :