Characterization of Quaternary Metal Oxide Films by Synchrotron X-ray Fluorescence Microprobe

Author: Perry D. L.   Thompson A. C.   Russo R. E.   Mao X. L.   Chapman K. L.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.51, Iss.12, 1997-12, pp. : 1781-1783

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