Linear and Nonlinear FEL-SEW Spectroscopic Characterization of Nanometer-Thick Films

Author: Alieva E. V.   Beitel G.   Kuzik L. A.   Sigarev A. A.   Yakovlev V. A.   Zhizhin G. N.   Meer A. F. G. Van Der   Wiel M. J. Van Der  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.51, Iss.4, 1997-04, pp. : 584-591

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Abstract