Author： Narita Yoshihito Tadokoro Toshiyasu Ikeda Teruki Saiki Toshiharu Mononobe Syuji Ohtsu Motoichi
Publisher： Society for Applied Spectroscopy
ISSN： 0003-7028
Source： Applied Spectroscopy, Vol.52, Iss.9, 1998-09, pp. : 1141-1144
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Abstract
Two-dimensional near-field Raman spectra and topographic images of the polydiacetylene surface are measured simultaneously by using a near-field Raman spectrometer. The spectra (located 100 nm apart) have different spectral features. The peak intensity ratio of two C = C peaks at 1520 and 1457 cm-1 does not correlate with the topographic image and shows differences in the subwavelength scale. These differences can be interpreted as spatial differences in the number of successive bonds on the polydiacetylene surface. In contrast, the near-field Raman intensity of the C = C bond at 1457 cm-1 correlates strongly with the topographic image. This phenomenon can be interpreted as a change in the efficiency of collecting Raman scattering light.
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