XPS Characterization of Bi and Mn Collected on Atom-Trapping Silica for AAS

Author: Suzer S.   Ertas N.   Ataman O. Y.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.53, Iss.4, 1999-04, pp. : 479-482

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content