Depth Profiling of Optical Absorption in Thin Films via the Mirage Effect and a New Inverse Scattering Theory. Part II: Experimental Reconstructions on Well-Characterized Materials

Author： Fu S. W.   Power J. F.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.54, Iss.1, 2000-01, pp. : 127-137

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