Error Analysis for Estimation of Trace Vapor Concentration Pathlength in Stack Plumes

Author： Gallagher Neal B.   Wise Barry M.   Sheen David M.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.57, Iss.6, 2003-06, pp. : 614-621

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