Reference Sample Method Reduces the Error Caused by Variable Cryosection Thickness in Fourier Transform Infrared Imaging

Author： Rieppo Jarno   Hyttinen Mika M.   Jurvelin Jukka S.   Helminen Heikki J.  

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.58, Iss.1, 2004-01, pp. : 137-140

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