Corroded Surface Roughness of Copper Analyzed by Fourier Transform Infrared Mapping Microscopy and Optical Profilometric Study

Author: Kasperek J.   Lefez B.   Beucher E.  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.58, Iss.2, 2004-02, pp. : 179-183

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