Deep-Ultraviolet Raman Microspectroscopy: Characterization of Wide-Gap Semiconductors

Author: Nakashima Shin-Ichi   Okumura Hazime   Yamamoto Taketsugu   Shimidzu Ryosuke  

Publisher: Society for Applied Spectroscopy

ISSN: 0003-7028

Source: Applied Spectroscopy, Vol.58, Iss.2, 2004-02, pp. : 224-229

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