Depth Profiling of Thick Layers of Graded Metal-Zirconia Ceramic Coatings Using Laser Ablation Inductively Coupled Plasma Atomic Emission Spectrometry

By Kanicky Viktor   Novotny Ivan   Musil Jan   Mermet Jean-Michel  

Applied Spectroscopy, Vol. 51, Iss. 7, 1997-07 ,pp. : 1042-1046

Society for Applied Spectroscopy

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Depth Profiling of the Optical Absorption Coefficient in Ultraviolet-Degraded Poly(vinylchloride) Films by Dual Beam Light Profile Microscopy

By Power J. F.   Fu S. W.   Nepotchatykh O. V.  

Applied Spectroscopy, Vol. 59, Iss. 4, 2005-04 ,pp. : 511-518

Society for Applied Spectroscopy

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Characteristics of Immersion Sampling Technique in Confocal Raman Depth Profiling

By Vyörykkä J.   Halttunen M.   Iitti H.   Tenhunen J.   Vuorinen T.   Stenius P.  

Applied Spectroscopy, Vol. 56, Iss. 6, 2002-06 ,pp. : 776-782

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Application of a New Quantitative Optical Depth Profiling Technique for the Diffusion of Polymers

By Ekgasi Sanong   Ishida Hatsuo  

Applied Spectroscopy, Vol. 51, Iss. 4, 1997-04 ,pp. : 461-465

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Depth Profiling (ICP-MS) Study of Trace Metal ‘Grains’ in Solid Asphaltenes

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Journal of The American Society for Mass Spectrometry, Vol. 22, Iss. 8, 2011-08 ,pp. : 1403-1408

Springer Publishing Company

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