Author: Cutler Patrick J. Haaland David M. Gemperline Paul J.
Publisher: Society for Applied Spectroscopy
ISSN: 0003-7028
Source: Applied Spectroscopy, Vol.63, Iss.3, 2009-03, pp. : 261-270
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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