Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization

Author： Garcia-Caurel Enric De Martino Antonello Gaston Jean-Paul Yan Li

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.67, Iss.1, 2013-01, pp. : 1-21

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