Author: Sierhuis Maarten Clancey William J. Hoof Ron J.J. Van
Publisher: Inderscience Publishers
ISSN: 1740-2123
Source: International Journal of Simulation and Process Modelling, Vol.3, Iss.3, 2007-09, pp. : 134-152
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract