An analysis of imperfect RFID visibility in a multi-echelon supply chain

Author: Buyurgan Nebil   Rossetti Manuel D.   Walker Ronald T.  

Publisher: Inderscience Publishers

ISSN: 1742-7967

Source: International Journal of Logistics Systems and Management, Vol.7, Iss.4, 2010-10, pp. : 431-455

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Abstract