Light scattering analysis, an NDT optical method for studying the electroerosion phenomenon

Author： Hogert E N Landau M R Aparicio R Gale M F Ruiz Gaggioli N G

Publisher： The British Institute of Non-Destructive Testing

ISSN： 1354-2575

Source： Insight - Non-Destructive Testing and Condition Monitoring, Vol.45, Iss.4, 2003-04, pp. : 263-265

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