Development of a low-cost permanently installed microelectronic wireless monitoring system for process plant inspection

Author: Liddle D   Henderson K   Eriksen M   Meng Chong Eu   Namyslo Udo   Wilcox S  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.47, Iss.12, 2005-12, pp. : 756-760

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