Ultrasonic thin film transducers for high-temperature NDT

Author: Kirk K J   Lee C K   Cochran S  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.47, Iss.2, 2005-02, pp. : 85-87

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Abstract