Low-coherence interferometry – an advanced technique for optical metrology in industry

Author: Dufour M L   Lamouche G   Detalle V   Gauthier B   Sammut P  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.47, Iss.4, 2005-04, pp. : 216-219

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Abstract