LS-SVMs-based reconstruction of 3-D defect profile from magnetic flux leakage signals

Author: Ji Fengzhu   Wang Changlong   Zuo Xianzhang   Hou Songshan   Liang Siyang  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.49, Iss.9, 2007-09, pp. : 516-520

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