Research on adhesive layer depth and frequency in weak interface of bonded structures

Author： Zhaoguo Qiu   Bin Wu   Cunfu He  

Publisher： The British Institute of Non-Destructive Testing

ISSN： 1354-2575

Source： Insight - Non-Destructive Testing and Condition Monitoring, Vol.53, Iss.6, 2011-06, pp. : 302-306

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