Sequential hypothesis testing for reflected signal recognition of time-of-flight estimation in ultrasonic defect detection

Author: Chen Hanxin   Shang Yunfei   Sun Kui  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.55, Iss.2, 2013-02, pp. : 66-71

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