Development of sputtered AlN thin-film ultrasonic transducers for durable high-temperature applications

Author: Hou R   Hutson D   Kirk K J  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.55, Iss.6, 2013-06, pp. : 302-307

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract