Étude des interfaces SiO2/TiO2 et TiO2/SiO2 dans la structure SiO2/TiO2/SiO2/c-Sipréparée par pulvérisation cathodique radio fréquence

Author： Hafidi K   Azizan M   Ijdiyaou Y   Ameziane E L  

Publisher： NRC Research Press

ISSN： 1208-6045

Source： Canadian Journal of Physics, Vol.85, Iss.7, 2007-07, pp. : 763-776

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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