Fiducial mark and nanocrack zone formation during thinfilm delamination

Author： Volinsky Alex A.   Moody Neville R.   Kottke Michael L.   Gerberich William W. G.  

Publisher： Taylor & Francis Ltd

ISSN： 0141-8610

Source： Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.82, Iss.17-18, 2002-11, pp. : 3383-3391

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