Errors due to scattering effects in multiple microphone intensity probes

Author: Steyer Glen   Singh Rajendra   Houser Donald R.  

Publisher: Institute of Noise Control Engineering

ISSN: 0736-2935

Source: INTER-NOISE and NOISE-CON Congress and Conference Proceedings, Vol.1984, Iss.1, 1984-12, pp. : 1139-1142

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Abstract