Author: Park Young-Chul Kanemitsu Yoichi Kijimoto Shinya Guo Shijie
Publisher: Institute of Noise Control Engineering
ISSN: 0736-2935
Source: INTER-NOISE and NOISE-CON Congress and Conference Proceedings, Vol.2004, Iss.6, 2004-08, pp. : 2042-2049
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Abstract