Calibration of a multilayer semiconductor spectrometer using α sources

Author: Gurov Yu.   Gusev K.   Karpukhin V.   Lapushkin S.   Morokhov P.   Sandukovsky V.   Yurkowski J.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-4412

Source: Instruments and Experimental Techniques, Vol.49, Iss.5, 2006-10, pp. : 624-628

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Abstract