An automatic setup for measuring low-field temperature dependencies of magnetoresistances of film samples

Author: Kim P.   Khalyapin D.   Bykova L.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-4412

Source: Instruments and Experimental Techniques, Vol.50, Iss.4, 2007-07, pp. : 547-549

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Abstract