Use of stress-engineered material layers for the measurement of interfacial fracture toughness of nanoscale thin films

Author： Zheng Jiantao   Sitaraman Suresh K.  

Publisher： Inderscience Publishers

ISSN： 0268-1900

Source： International Journal of Materials and Product Technology, Vol.34, Iss.1-2, 2009-01, pp. : 131-138

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