Inspection of surface defects in copper strip using multivariate statistical approach and SVM

Author: Zhang Xue-Wu   Gong Fang   Xu Li-Zhong  

Publisher: Inderscience Publishers

ISSN: 0952-8091

Source: International Journal of Computer Applications in Technology, Vol.43, Iss.1, 2012-03, pp. : 44-50

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Abstract